X-ray spectroscopy station for sample characterization at ELI Beamlines

Par un écrivain mystérieux

Description

X-ray spectroscopy station for sample characterization at ELI Beamlines
Ultrafast optical spectroscopy ELI Beamlines – Dolní Břežany
X-ray spectroscopy station for sample characterization at ELI Beamlines
Photonics, Free Full-Text
X-ray spectroscopy station for sample characterization at ELI Beamlines
A multipurpose end-station for atomic, molecular and optical sciences and coherent diffractive imaging at ELI beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
XAFS 2021 Virtual: Newly established X-ray spectroscopy user endstation at ELI-Beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
Available Equipment (ELI-ERIC)
X-ray spectroscopy station for sample characterization at ELI Beamlines
A multipurpose end-station for atomic, molecular and optical sciences and coherent diffractive imaging at ELI beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
a) Peak brightness for different X-ray sources: The APS synchrotron in
X-ray spectroscopy station for sample characterization at ELI Beamlines
High Precision X-Ray Measurements 2023 (19-23 June 2023) · Agenda (Indico)
X-ray spectroscopy station for sample characterization at ELI Beamlines
X-ray Absorption Spectroscopy - Ceric
X-ray spectroscopy station for sample characterization at ELI Beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
X-ray spectroscopy station for sample characterization at ELI Beamlines
Compact high-flux X-ray source based on irradiation of solid targets by gigahertz and megahertz bursts of femtosecond laser pulses
X-ray spectroscopy station for sample characterization at ELI Beamlines
PDF] A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies.
X-ray spectroscopy station for sample characterization at ELI Beamlines
PDF] A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies.
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